Voltage Sag Immunity
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Marketing Claim Verified by UL Solutions
SEMI F47 Voltage Sag Immunity Characteristics Verified
Verification Method
Assessment conducted per: - SEMI F47-0706 (Reapproved 0812), Specification for Semiconductor Processing Equipment Voltage Sag Immunity - IEC 61000-4-11, Electromagnetic compatibility (EMC) - Part 4-11: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current up to 16 A per phase - IEC 61000-4-34, Electromagnetic compatibility (EMC) - Part 4-34: Testing and measurement techniques - Voltage dips, short interruptions and voltage variations immunity tests for equipment with input current more than 16 A per phase The following performance was observed: Sag Depth 50%: Duration at 50 Hz = 10 cycles, Duration at 60 Hz = 12 cycles Sag Depth 70%: Duration at 50 Hz = 25 cycles, Duration at 60 Hz = 30 cycles Sag Depth 80%: Duration at 50 Hz = 50 cycles, Duration at 60 Hz = 60 cycles
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